Toshiba pcx2500

[drewmerc]

TCK – the TCK or 'test clock' synchronizes the internal state machine operations
TMS – the TMS or 'test mode state' is sampled at the rising edge of TCK to determine the next state.
TDI – the TDI or 'test data in' represents the data shifted into the device's test or programming logic. It is sampled at the rising edge of TCK when the internal state machine is in the correct state.
TDO – the TDO or 'test data out' represents the data shifted out of the device's test or programming logic and is valid on the falling edge of TCK when the internal state machine is in the correct state.
TRST – the TRST or 'test reset' is an optional pin which, when available, can reset the TAP controller's state machine.
GND - the GND or 'ground'

these are the only pins i think about those 2 pins are optional